Shanghai Baihe Instrument Technology Co., Ltd. (Shanghai Baihe Instrument Technology Co., Ltd.)
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378 Series - Mikroskop ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye
378 Series - Semiconductor Detection Microscope FS-70 Optical System ye looi FS60 model (ye kɔrɔ FS70 model). 378 Series - Semiconductor Detection Mic
Detalji proizvoda

378 Series - Features of a Semiconductor Detection Microscope FS-70
1. Optical system kënë fuu looi FS60 model (ye FS70 model) ye ɣaac apɛi.
A ka kɛ mikroskop ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye.
2.FS70L ye dɛmɛ 3 ye dɛmɛ ye dɛmɛ ye dɛmɛ ye dɛmɛ ye dɛmɛ ye dɛmɛ ye dɛmɛ ye dɛmɛ ye dɛmɛ ye dɛmɛ ye dɛmɛ ye dɛmɛ ye dɛmɛ ye dɛmɛ ye dɛmɛ ye dɛmɛ ye dɛmɛ ye dɛmɛ Kɔnɔ ye laser luɔ̈ɔ̈i bɛ̈n juak. Ku na yɔ̈ɔ̈k, ka tɛ̈n yenë Sanfeng measuring instruments luɔ̈ɔ̈i thïn, ka tɛ̈n yenë a tɛ̈n yenë a tɛ̈n yenë a tɛ̈n yenë a tɛ̈n yenë a tɛ̈ An ye raan dɔ̈ɔ̈t bï yïn tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈
FS70Z's standard functions are: bright field of view, differential interference contrast (DIC), and polarization observation. FS70Z's standard functions are: bright field of view, differential interference contrast (DIC), and polarization observation. FS70L ku FS70L4 acie DIC kony. 4. Luɔ̈ɔ̈i de converter ye tɔ̈ɔ̈u yen bɛ̈n looi bɛ̈n looi bɛ̈n looi bɛ̈n looi bɛ̈n looi bɛ̈n looi.
5. Luɔi nɔgɔ: FS70 ye luui në optik ye cɔl (ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n

378 Series - Parameters of Performance for Semiconductor Detection Microscope FS-70 - Parameters of Performance for Semiconductor Detection Microscope FS-70 - Parameters of Performance for Semiconductor Detection Microscope FS-70 - Parameters of Performance for Semiconductor Detection Microscope FS-70

Model

FS-70

FS70-TH

FS70Z

FS70Z-TH

FS70L

FS70L-TH

FS70L4

JS70L4-TH

Namba

378-184-1

378-184-3

378-185-1

378-185-3

378-186-1

378-186-3

378-187-1

378-187-3

Model basis koor

FS70-S

FS70-THS

FS70Z-S

FS70Z-THS

FS70L-S

FS70L-THS

FS70L4-S

FS70L4-THS

Namba

378-184-2

378-184-4

378-185-2

378-185-4

378-186-2

378-186-4

378-187-2

378-187-4

Fokus

50mm stroke, concentric focal distance thickening (3.8mm/rev) and fine-tuning (0.1mm/rev) hand wheel (left, right 0)

Foto

Distance ye

Siedentopf type, adjustable range

Nombre de sites de vue

24

Tilt

0° ka 20°

0° ka 20°

0° ka 20°

0° ka 20°

Pass Rate

50/50

100/0 wala 0/100

50/50

100/0 wala 0/100

100/0 wala 0/100

100/0 wala 0/100

100/0 wala 0/100

100/0 wala 0/100

Lens Tube

Filter laser ye tɔ̈ɔ̈u

Laser luɔɔi

2×zoom

Laser luɔɔi

1064/532/355mm

532/355mm

Port kamera

C-mount (ye adapter B ye kuany)

Luɔi laser ye kek TV port

C-mount socket (keke green filter switch)

Lighting system, optional

Lighting reflective field (Kohler lighting, with aperture) 12V 100W fiber optic, no polar brightness adjustment, light conductivity length: 1.5m, power consumption 150W

Object, optional

M Plan Apo,M Plan Apo SL, G Plan Apo

Object, optional

M/LCD Plan NIR

M/L CD Plan NUV

M Plan UV

M Plan UV

Load

14.5kg

13.6kg

14.1kg

13.2kg

14.5kg

13.6kg

14.1kg

13.2kg

Weight (host)

6.1kg

7.1kg

6.6kg

7.5kg

6.1kg

7.1kg

6.6kg

7.5kg


378 Series - Parameters Technical for Semiconductor Detection Microscope FS-70 - Parameters Technical for Semiconductor Detection Microscope FS-70 - Parameters Technical for Semiconductor Detection Microscope FS-70 - Parameters Technical for Semiconductor Detection Microscope FS-70
Fokus
Dɛ̈ɛ̈r: Kuen ye cɔl concentric rough and fine-tuning wheel (left and right)
Range: 50mm measuring range, fine tuning 0.1mm/rev concentric thickness 3.8mm/rev
Foto ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n
Yɔɔr: Siedentopf
Ajuiɛɛr: 51-76mm
Yi'en: 24
Tilt angle: 0°-20° (ye luui në -TH, THS model)
Lighting system: bright field reflective lighting (Kohler lighting, with aperture)
Light source: 12V100W fiber optic, no polar brightness adjustment), light guide length 1.5m, power consumption 150W
Objective (option): M Plan Apo, M Plan Apo SL, G Plan Apo

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