378 Series - Features of a Semiconductor Detection Microscope FS-70
1. Optical system kënë fuu looi FS60 model (ye FS70 model) ye ɣaac apɛi.A ka kɛ mikroskop ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye.
2.FS70L ye dɛmɛ 3 ye dɛmɛ ye dɛmɛ ye dɛmɛ ye dɛmɛ ye dɛmɛ ye dɛmɛ ye dɛmɛ ye dɛmɛ ye dɛmɛ ye dɛmɛ ye dɛmɛ ye dɛmɛ ye dɛmɛ ye dɛmɛ ye dɛmɛ ye dɛmɛ ye dɛmɛ ye dɛmɛ Kɔnɔ ye laser luɔ̈ɔ̈i bɛ̈n juak. Ku na yɔ̈ɔ̈k, ka tɛ̈n yenë Sanfeng measuring instruments luɔ̈ɔ̈i thïn, ka tɛ̈n yenë a tɛ̈n yenë a tɛ̈n yenë a tɛ̈n yenë a tɛ̈n yenë a tɛ̈ An ye raan dɔ̈ɔ̈t bï yïn tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈
FS70Z's standard functions are: bright field of view, differential interference contrast (DIC), and polarization observation. FS70Z's standard functions are: bright field of view, differential interference contrast (DIC), and polarization observation. FS70L ku FS70L4 acie DIC kony. 4. Luɔ̈ɔ̈i de converter ye tɔ̈ɔ̈u yen bɛ̈n looi bɛ̈n looi bɛ̈n looi bɛ̈n looi bɛ̈n looi bɛ̈n looi.
5. Luɔi nɔgɔ: FS70 ye luui në optik ye cɔl (ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n
378 Series - Parameters of Performance for Semiconductor Detection Microscope FS-70 - Parameters of Performance for Semiconductor Detection Microscope FS-70 - Parameters of Performance for Semiconductor Detection Microscope FS-70 - Parameters of Performance for Semiconductor Detection Microscope FS-70
Model |
FS-70 |
FS70-TH |
FS70Z |
FS70Z-TH |
FS70L |
FS70L-TH |
FS70L4 |
JS70L4-TH |
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Namba |
378-184-1 |
378-184-3 |
378-185-1 |
378-185-3 |
378-186-1 |
378-186-3 |
378-187-1 |
378-187-3 |
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Model basis koor |
FS70-S |
FS70-THS |
FS70Z-S |
FS70Z-THS |
FS70L-S |
FS70L-THS |
FS70L4-S |
FS70L4-THS |
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Namba |
378-184-2 |
378-184-4 |
378-185-2 |
378-185-4 |
378-186-2 |
378-186-4 |
378-187-2 |
378-187-4 |
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Fokus |
50mm stroke, concentric focal distance thickening (3.8mm/rev) and fine-tuning (0.1mm/rev) hand wheel (left, right 0) |
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Foto |
Dɛ |
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Distance ye |
Siedentopf type, adjustable range |
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Nombre de sites de vue |
24 |
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Tilt |
|
0° ka 20° |
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0° ka 20° |
|
0° ka 20° |
|
0° ka 20° |
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Pass Rate |
50/50 |
100/0 wala 0/100 |
50/50 |
100/0 wala 0/100 |
100/0 wala 0/100 |
100/0 wala 0/100 |
100/0 wala 0/100 |
100/0 wala 0/100 |
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Lens Tube |
|
Filter laser ye tɔ̈ɔ̈u |
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Laser luɔɔi |
1× |
1× |
1× |
2×zoom |
1× |
1× |
1× |
1× |
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Laser luɔɔi |
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|
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|
1064/532/355mm |
532/355mm |
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Port kamera |
C-mount (ye adapter B ye kuany) |
Luɔi laser ye kek TV port |
C-mount socket (keke green filter switch) |
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Lighting system, optional |
Lighting reflective field (Kohler lighting, with aperture) 12V 100W fiber optic, no polar brightness adjustment, light conductivity length: 1.5m, power consumption 150W |
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Object, optional |
M Plan Apo,M Plan Apo SL, G Plan Apo |
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Object, optional |
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M/LCD Plan NIR M/L CD Plan NUV |
M Plan UV |
M Plan UV |
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Load |
14.5kg |
13.6kg |
14.1kg |
13.2kg |
14.5kg |
13.6kg |
14.1kg |
13.2kg |
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Weight (host) |
6.1kg |
7.1kg |
6.6kg |
7.5kg |
6.1kg |
7.1kg |
6.6kg |
7.5kg |
378 Series - Parameters Technical for Semiconductor Detection Microscope FS-70 - Parameters Technical for Semiconductor Detection Microscope FS-70 - Parameters Technical for Semiconductor Detection Microscope FS-70 - Parameters Technical for Semiconductor Detection Microscope FS-70
Fokus
Dɛ̈ɛ̈r: Kuen ye cɔl concentric rough and fine-tuning wheel (left and right)
Range: 50mm measuring range, fine tuning 0.1mm/rev concentric thickness 3.8mm/rev
Foto ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n
Yɔɔr: Siedentopf
Ajuiɛɛr: 51-76mm
Yi'en: 24
Tilt angle: 0°-20° (ye luui në -TH, THS model)
Lighting system: bright field reflective lighting (Kohler lighting, with aperture)
Light source: 12V100W fiber optic, no polar brightness adjustment), light guide length 1.5m, power consumption 150W
Objective (option): M Plan Apo, M Plan Apo SL, G Plan Apo