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Ion grinder IM4000II

Hitachi Ion Grinder IM4000II ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r. A lëu bɛ̈n ya tɔ̈ɔ̈u në luɔɔi juëc cït low temperature contr

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Ion grinder IM4000II

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离子研磨仪 IM4000II

Hitachi Ion Grinder IM4000II ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r. A lëu bɛ̈n ya tɔ̈ɔ̈u në luɔɔi juëc cït low temperature control ku jɔl ya vacuum transfer, ku bɛ̈n ya tɔ̈ɔ̈u në luɔɔi juëc cït section grinding for different samples.

Karakteristika
Awowa
Specifications

Karakteristika

Kɔl ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l

IM4000II ye luui në 500 μm/h^*1Kä ye cɔl ion guns ye tɔ̈u nhial. Ku na yɔɔd dɛ, ka lëu bɛ̈n looi ka tɛ̈n yenë kek looi.

*1: Ka Si tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye

Sample: Sip (2 mm thickness)
Voltage: 6.0 kV
Yïïn cï rot looi: ±30°
Waktu ye looi: 1 hour

N'a tɛ̈n yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen Foto dɔ̈ɔ̈ŋ ye Si ye looi ka tɛmɛ ±15° ka tɛmɛ ±15° ka tɛmɛ ±15° ka tɛmɛ ±15° ka tɛmɛ ±15°. Ka tɛ̈n ye kë ye cɔl swinging angle, kä wɛrɛw tɛ̈n ye cɔl processing conditions. N'a tɛmɛ a tɛmɛ a tɛmɛ a tɛmɛ a tɛmɛ a tɛmɛ a tɛmɛ a tɛmɛ a tɛmɛ a tɛmɛ a tɛmɛ.
Ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ.

Sample: Sip (2 mm thickness)
Voltage: 6.0 kV
Yïïn cï rot looi: ±15°
Waktu ye looi: 1 hour

Masin grinding kompozit

Seksiyon grinding

Cɔl lëu lëu lëu lëu lëu lëu lëu lëu lëu lëu lëu lëu lëu lëu lëu lëu lëu lëu lëu lëu lëu lëu lëu lëu lëu lëu lëu lëu lëu lëu lëu lëu lëu lëu lëu lëu lëu lëu lëu lëu lëu lëu lëu
Ka tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ
Samples lëu bï ya naŋ 20 mm (W) × 12 mm (D) × 7 mm (H)

Kä ye looi në section grinding

Lɔ̈ɔ̈i de kä ye kek looi në metal ku jɔl ya kä ye kek looi, polymer ku jɔl ya kä ye kek looi
Sample section preparation with specific locations such as cracks and gaps. Sample section preparation with specific locations such as cracks and gaps. Sample section preparation with specific locations such as cracks and gaps. Sample section preparation with specific locations such as cracks and gaps.
Lɔ̈ɔ̈i de kä ye kek looi në kä juëc yiic ku jɔl ya luɔɔi de kä ye kek looi në EBSD

Flat grinding

Kuen ye kek looi ye kek looi ye kek looi ye kek looi ye kek looi ye kek looi ye kek looi ye kek looi ye kek looi ye kek looi ye kek looi ye kek looi
Application Fields Wide
Sample ye tɔ̈u në 50 mm × 25 mm
A lëu bï rot ya kuanycök ku bï rot ya kuanycök (±60°, ±90° bï rot ya kuanycök)

Kä ye looi në flat grinding

Lɔ̈k kä ye kek tɔ̈ɔ̈u ku kä ye kek tɔ̈ɔ̈u ku kä ye kek tɔ̈ɔ̈u ku kä ye kek tɔ̈ɔ̈u ku kä ye kek tɔ̈ɔ̈u
Gɛlɛ hap de sampol
Lɔ̈ɔ̈m ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r

Awowa

Low Temperature Control Function^*1

Nitrogen ye tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u. IM4000II ee tɔ̈u në tɛmɛ de tɛmɛ de tɛmɛ de tɛmɛ de tɛmɛ de tɛmɛ de tɛmɛ de tɛmɛ de tɛmɛ de tɛmɛ de tɛmɛ.

*1 A wïc ba order looi në kaam tök kenë host.

常温研磨
Grinding at normal temperature

冷却研磨（-100℃）
Kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl

Sample: kä ye kek tɔ̈ɔ̈u në plastik ye kek tɔ̈ɔ̈u në plastik ye kek tɔ̈ɔ̈u në plastik ye kek tɔ̈ɔ̈u në plastik ye kek tɔ̈ɔ̈u

Vacuum transfer function

Samples after ion grinding can be transferred directly to SEM without touching the air. Samples after ion grinding can be transferred directly to SEM without touching the air. Samples after ion grinding can be transferred directly to SEM without touching the air. Samples after ion grinding can be transferred directly to SEM without touching the air.^*1、 AFM^*2Yüksek. Vacuum transfer function and low temperature control function can be used simultaneously. Vacuum transfer function and low temperature control function can be used simultaneously. Vacuum transfer function and low temperature control function can be used simultaneously. Vacuum transfer function and low temperature control function can be used simultaneously. (Fɛɛrɛ ye cɔl 'vacuum transfer function' ye cɔl 'flat grinding' ye cɔl 'low temperature control function' ye cɔl 'low temperature control function' ye cɔl 'low temperature control function' ye cɔl 'low temperature control function'.

*1 Hitachi FE-SEM ye tɔ̈ɔ̈u në kë ye tɔ̈ɔ̈u në kë ye tɔ̈ɔ̈u në kë ye tɔ̈ɔ̈u në kë ye tɔ̈ɔ̈u në kë ye tɔ̈ɔ̈u
*2 Hitachi AFM ye cɔl vacuum ye kony.

真空转移功能

Mikroskop ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r

A ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye Mikroskop ye tɔ̈u CCD kamera ye tɔ̈u CCD kamera ye tɔ̈u CCD kamera ye tɔ̈u CCD kamera ye tɔ̈u CCD kamera ye tɔ̈u CCD kamera ye tɔ̈u CCD kamera ye tɔ̈u CCD kamera A lëu ba mikroskop ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n

察加工过程的体式显微镜

Specifications

Main Content
Gas luɔɔi	Argon
Argon flow control	Kualitas flow control
Voltage acceleration	0.0 ～ 6.0 kV
Size	616(W) × 736(D) × 312(H) mm
Weight ye	53 kg + pomp mekanik 30 kg
Seksiyon grinding
Lɛɛr ye looi (Si material)	500 µm/h^*1Yɔ̈ɔ̈k
Maksimum Sample Size	20(W）×12(D）×7（H）mm
Sample Movement Range	X±7 mm, Y 0 ~+3 mm
Ion beam intermittent processing function Open/Close Time Range	1 sekond - 59 minit 59 sekond
Swing angle	±15°, ±30°, ±40°
Wide-area section grinding function	-
Flat grinding
Maximum processing range	φ32 mm
Maksimum Sample Size	Φ50 X 25 (H) mm
Sample Movement Range	X 0～＋5 mm
Ion beam intermittent processing function Open/Close Time Range	1 sekond - 59 minit 59 sekond
Rotational Speed (Rotational Speed)	1 rpm、25 rpm
Swing angle	±60°, ±90°
Tilt angle	0 ～ 90°

*1 Si ye tɛ̈n tɔ̈ɔ̈u 100 μm ka tɛ̈n tɔ̈ɔ̈u lɛ̈ɛ̈r tök.

Awowa

Proyek	Wël
Low Temperature Control Function^*2	Sample cooling indirectly through liquid nitrogen, temperature setting range: 0°C to -100°C
Super hard blocker	Lɔ̈ɔ̈m ye kɔc luɔ̈ɔ̈i ye kɔc luɔ̈ɔ̈i ye kɔc luɔ̈ɔ̈i ye kɔc luɔ̈ɔ̈i ye kɔc luɔ̈ɔ̈i
Mikroskop ye luɔɔi luɔɔi	15× ~ 100× double-eyed, triple-eyed (CCD)

*2 A wïc ba order looi në kaam tök kenë host. Tɛ̈n yenë luɔɔi de cooling temperature control function looi, ka tɛ̈n yenë luɔɔi de cooling temperature control function looi, ka tɛ̈n yenë luɔɔi de cooling temperature control function looi.

Kategori Karewa

Elektron mikroskop ye cɔl Field Emission Scanning Microscope (FE-SEM)
Mikroskop Elektron (SEM)
Mikroskop elektron ye cath (TEM/STEM)

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Ion grinder IM4000II

Karakteristika

Awowa

Specifications

Karakteristika

Kɔl ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l

Masin grinding kompozit

Seksiyon grinding

Kä ye looi në section grinding

Flat grinding

Kä ye looi në flat grinding

Awowa

Low Temperature Control Function*1

Vacuum transfer function

Mikroskop ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r

Specifications

Awowa

Kategori Karewa

Low Temperature Control Function^*1