MIC 20 Ultrasonic/Richter Dual-Use Hardness Meter Combined Hardness Meter- Fornitore global

Room 1013, No. 20, Lane 26, Hexin Road, Jiading District, Shanghai (Office Building No. 5, Jiangqiao Wanda Square)

MIC20 Ultrasonic/Richter Hardness Meter ye luui yiiProduct overview:

MIC20 Ultrasonic/Richter Hardness MeterA fɔlɔ ye quasi staticUCI (Ultrasonic Contact Impedance Method) kuDinamikBounce Hardness Detection MethodA lëu1001 luɔɔi.MIC 20 ye "merge-to-one" ye kɛ toor ye kɛ toor ye kɛ toor ye kɛ toor ye kɛ toor ye kɛ toor ye kɛ toor ye kɛ toor ye kɛ toor ye kɛ toor ye kɛ toor ye kɛ toor ye kɛ toor ye kɛ toor ye kɛ toor ye kɛ toor ye kɛ toor ye kɛ toor ye kɛ toor ye kɛ toor yeNɛnYïn bɛ se ka tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n，Yïn alëu ba tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye.

MIC20 Ultrasonic/Richter Hardness MeterCanA be kɛ̈ɛ̈r ye, a be kɛ̈ɛ̈r ye, a be kɛ̈ɛ̈r ye, a be kɛ̈ɛ̈r ye, a be kɛ̈ɛ̈r ye. Lɔ̈ɔ̈i ye kɛ̈n ye kɛ̈n ye kɛ̈n ye kɛ̈n ye kɛ̈n ye kɛ̈n ye kɛ̈n ye kɛ̈n. MIC20 ka lëu bï ya looi në luɔɔi tök yic, ku ka lëu bï ya juak në luɔɔi de kä ye kek looi në luɔɔi de kä ye kek looi në luɔɔi de kä ye kek looi në luɔɔi de kä ye kek looi në luɔɔi de kä ye kek looi në luɔɔi de kä ye kek looiYe.

MIC20 Ultrasonic/Richter Hardness Meter ye luui yii TestingMetod： 1UCI (Ultrasonic Contact Impedance Method)：Ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ.2Metode de bounce（ASTM A956）：A impactor ye tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u，A tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛKɔnɔŋ ye kɔnɔŋ ye kɔnɔŋ ye kɔnɔŋ ye kɔnɔŋ ye kɔnɔŋ ye kɔnɔŋ ye kɔnɔŋ ye kɔnɔŋ ye kɔnɔŋ ye kɔnɔŋ ye kɔnɔŋNa cï yïn UCI probe wala bounce shock device mat, MIC20 abï tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen t

MIC20 Ultrasonic/Richter Hardness Meter ye luui yiiProdukFeatures:

1UCI (ASTM) A1038) ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n A956)2UCI probe ye tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n3.Kä ye kek looi në kë de kä ye kek looi në kë de kä ye kek looi në kë de kä ye kek looi në kë de kä ye kek looi në kë de kä ye kek looi në kë de kä ye kek looi4.Kä ye tɛmɛ, ka tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ5Lɔ̈ɔ̈i në keys ku/ka touch screen cï gɔ̈ɔ̈r, ka tɛ̈n yenë wɛ̈t cï gɔ̈ɔ̈r6.Power Supply: AC (100V-240V) wala Nickel Hydrogen Battery7Data ye gɔ̈ɔ̈r në ɣän kɔ̈k yiic, a lëu bï ya gɔ̈ɔ̈r në kä ye kek them në 50008A lëu bï kalibrasiɔn ya looi në pɛ̈ɛ̈i ku yic në kë de kä juëc cï kek ya them. A lëu bï kalibrasiɔn ya tɔ̈ɔ̈u ku bï ya tɔ̈ɔ̈u9No directional measurement, no need to enter any corrective factors. No need to enter any corrective factors. No need to enter any corrective factors. No need to enter any corrective factors. No need to enter any corrective factors.10TFT screen ye dɔɔni ye dɔɔni ye dɔɔni ye dɔɔni ye dɔɔni ye dɔɔni ye dɔɔni ye dɔɔni ye dɔɔni ye dɔɔni ye dɔɔni ye dɔɔni ye dɔɔni ye dɔɔni ye dɔɔni ye dɔɔni11Lɔ̈k data tɔ̈ɔ̈u, ka tɛ̈n yenë kɔc ye tɛ̈n yenë kɔc ye tɛ̈n yenë kɔc ye tɛ̈n yenë kɔc ye tɛ̈n yenë kɔc ye tɛ Serial measurement values can be called out and edited. A lëu bɛ̈ɛ̈i bɛ̈ɛ̈i bɛ̈ɛ̈i bɛ̈ɛ̈i

MIC20 Ultrasonic/Richter Hardness Meter ye luui yiiApplication Range：

MIC20 alëu bï yïn kë wïc looi ya looi.Misal, UCI tɛmɛ:1Ha masiniw cï kek mat2Wɛ̈t ye cɔl thermal impact zone (cït mɛn, pip)3.Në luɔɔi (cïmën de print industry)4.Në ɣän cï röt looi (cït mɛn, ɣän cï röt looi wala ɣän cï röt looi)Misal, tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ1Në motɛr unit wala në minɛn cï looi në steel ku aluminium2On solid rough particle components with a rolling surface3.Në luɔɔi de kä juëc ye kek looi4.Differentiate Filtering Materials (Yɛl-dɛ-dɛ-dɛ-dɛ-dɛ-dɛ-dɛ-dɛ-dɛ-dɛ-dɛ)5On a forged copper alloy

MIC20 Ultrasonic/Richter Hardness Meter ye luui yii Sonde Detail:

Sonde UCI ultrasonik
Sonde handheld:
10N ((1kgf)	Standart	MIC201-A
	Sonde koor	MIC201-AS
	Long probe	MIC201-AL
50N ((5kgf)	Standart	MIC205-A
	Sonde koor	MIC205-AS
	Long probe	MIC205-AL
98N ((10kgf)	Standart	MIC2010-A
Sonde elektrik:
8.6N ((0.9kgf)		MIC211-A
3N ((0.3kgf)		MIC2103-A
1N ((0.1kgf)		MIC2101-A
Richter bounce probe
Dyna D ye: Φ3 mm carbon tungsten alloy ball head
Dyna G ye: Φ5 mm carbon tungsten alloy ball head
Dyna E ye: Diamond Stone

MIC20 Ultrasonic/Richter Hardness Meter ye luui yii Parameters teknis：

Detection Range/Converter (Ultrasonic UCI)	20~1740HV/76~618HB/41~105HRB/20.3~68.0HRC/255~2180N/mm2(98N/10kgf ye cɔl probe)
Range of measurement/conversion (Richter bounce)	150~1000HL/750~1000HV/75~700HB/30~100HS/35~100HRB/19~70HRC/250~2200N/mm2(A leŋ kä ye kek looi ku kä ye kek looi)
Nyuɔ̈th	Lɔ̈ɔ̈i ye nyuɔɔth wala TFT ye nyuɔɔth, 1/4VGA, 5.7 inch, 115.2x76.8mm
Tɔm luɔi	German, English
Operating System	WinCE
Convert	Luɔi ë DIN 50150, ASTM E 140
Evaluation	Nyuɔ̈th data dɔ̈ɔ̈r tɔ̈u në curves, columnar charts wala tables; Statistics calculated, such as: average value, standard deviation, maximum minimum value, etc. Statistics calculated, such as: average value, standard deviation, maximum minimum value, etc. Statistics calculated, such as: average value, standard deviation, maximum minimum value, etc.
Automatic shutdown	User customized, save automatic detection data and instrument settings and shut down
Bateri	Ne bateri NiMH ye tɔ̈u, MIC20 alëu bï luui në lɛr naani ye. Lɛɛr ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n
Keyboard	Seal film keyboard touch
Interface	RS232, Ethernet 10Mbit
Temperature Range	Tɛmɛ: 0 ~ 50 ℃, tɛmɛ: 20 ~ 70 ℃
Dimension Weight	78x215x180mm(Dïth X Dïth X Dïth)1.4kg (cïmën de batɛri)

MIC20 Ultrasonic/Richter Hardness Meter ye luui yii Configuration ye raanKu accessories：MIC20 Host；TFT LCD Display；AC adaptɛr；Battery charger NiMH (100 to 240 VAC adaptive)；

Bateri NiMH；Instrument Box；Manual de luɔiYe.

Aksesɛr：

Shipping boxes, various guiding devices and support devices (UCI method), detection accessories (bounce-back method), hardness reference boards, and containing certified test blocks, NiMH batteries, battery driven grinding kits for surface treatment, printing cables, applications, data transmission cables