Kä ye looi:
A bɛ looi ka tɛmɛ ka tɛmɛ ka tɛmɛ, ka tɛmɛ, ka tɛmɛ, ka tɛmɛ, ka tɛmɛ, ka tɛmɛ, ka tɛmɛ, ka tɛmɛ, ka tɛmɛ, ka tɛmɛ, ka tɛmɛ, ka tɛmɛ, ka tɛmɛ, ka tɛmɛ, ka tɛmɛ, ka tɛmɛ, ka tɛmɛ A lëu bï GB, ISO, JIS, DIN, ASTM wala kɔ̈k peei ya looi.
A be tɔ̈u në luɔɔi de kɔrɔ̈ɔ̈ŋ, koom, metallurgy, petrol, mine, motɛr, masini, transport, electricity, construction, building materials, scientific research units, universities, quality inspection and business inspection departments. A ye tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenëYe.
Karakteristika Struktur:
1、Adopting international most advanced high rigidity door host structure, geometry precision high, no deformation, durable and reliable.
22, double test space, low station, large trip, test adaptability strong, high efficiency.
3、Full digital AC servo speed adjustment system and servo motor, run smooth, quick response, no noise.
4、High precision load sensors and displacement sensors, to achieve precision measurements.
5、Precision ball screw pay, no gap precision transmission, achieve large range of test speed adjustment.
6、Digital design total control system, achieve high precision, wide range of measurements,Three closed loop (force, deformation, displacement) control system, achieving power, deformation, displacement full digital three closed loop control, each control mode can automatically smooth switch without impact.
7Microcomputer control whole test process, can perform test force, deformation, displacement etc. speed control and maintenance. Microcomputer control whole test process, can perform test force, deformation, displacement etc. speed control and maintenance. Microcomputer control whole test process, can perform test force, deformation, displacement etc. speed control and maintenance. A tɔŋ de low week load cycle, deformation cycle, shift cycle.
8、Real-time dynamic display load value, displacement value, deformation value, test speed and test curve.
9Computer data processing analysis system, test results and test curves can automatically save printing, curve passing repeat test process, or making curve comparison, curve amplification. Computer data processing analysis system, test results and test curves can automatically save printing, curve passing repeat test process, or making curve comparison, curve amplification.
10、Automatic seek tensile strength, yielding strength, breaking strength, elastic modulus, specify non-proportional extension strengthRP0.2Kä kɔ̈k peei cït kä ye kek looi, ka kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈
11ChineseWindowsSoftware ye kɔc cï puɔ̈l ye kɔc cï puɔ̈l ye kɔc cï puɔ̈l ye kɔc cï puɔ̈l ye kɔc cï puɔ̈l ye kɔc cï puɔ̈l ye kɔc cï puɔ̈l ye kɔc cï puɔ̈l ye kɔc cï puɔ̈l ye
12A naŋ gël gël gël gël gël gël gël gël gël gël gël gël gël gël gël gël gël gël gël gël gël gël gël gël gël gël gël gël gël gël gël gël gël gël gël gël gël gël gël gël gël
13A kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ
14、Housing high-grade electrostatic spraying, machine whole atmosphere beautiful;
15、Ka tɛmɛ 标准:GB/T16491-1996Elektronik Universal Testing Machine
Ajuiɛɛr:
Lifting Fixtures 1set ye; Bending clamps1set ye; Compression clamps1Set
Wurting Configuration:
Elektronik ekstensiometri; Bending clamps1set, deformation kura; High and low temperature boxes (Dɔŋ-dɔŋ-dɔŋ-dɔŋ-dɔŋ-dɔŋ-dɔŋ-dɔŋ-dɔŋ-dɔŋ) Furnace de température élevée;TTable de luɔi, a lëu bï ya looi në kë de kä ye kek looi në kë de kä ye kek looi në kë de kä ye kek looi në kë de kä ye kek looi në kë de kä ye kek looi në kë de kä ye kek looi.
Kä ye nyuɔɔth në teknoloji:
Model |
WDW-100 |
WDW-200 |
WDW-300 |
WDW-600 |
Wɛ̈ɛ̈r dɔ̈ŋ (KN) |
1%(0.2%)-100%FS |
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Level of accuracy |
1Level wala0.5Level |
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Resolution Power Testing |
A maximum test force1/500000Ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ |
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Error Relative Shift |
A gël kä ye nyuɔɔth±0.5% |
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Range de vitesse de beam |
0.005 mm/min~500mm/min, No-step speed, ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan Setup |
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Variable measurement accuracy (Dɛ̈l-dɛ̈l-dɛ̈l-dɛ̈l-dɛ̈l-dɛ̈l) |
≤±0.5% |
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Space ye laar(mm) |
600 |
650 |
700 |
740 |
Space ye compressed(mm) |
600 |
650 |
700 |
740 |
Tɛstɛr width(mm) |
400 |
550 |
620 |
650 |
Thickness of flat sample (Thickness of flat sample)(mm) |
0~14 |
0~20 |
0~20 |
0~20 |
Diameter Sample(mm) |
φ4~φ22 |
Φ9~φ26 |
Φ9~φ26 |
Φ9~φ26 |
Size ë host |
750*500*2000 |
1010*820*2500 |
1150*840*2720 |
1150*850*2850 |
Pɛɛr (kg) |
800 |
1600 |
2000 |
3000 |
