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Ultra High Resolution Launch Scanning Electronic Microscope SU8600 Series
Ka tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ t SU8600 series ee tɛ̈n yenë Regulus8200 series ye t
Detalji proizvoda
Ultra High Resolution Launch Scanning Electronic Microscope SU8600 Series
Ka tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ t SU8600 series ee tɛ̈n yenë Regulus8200 series ye tɛ̈n yenë kɔc ye tɛ̈n yenë kɔc ye tɛ̈n yenë kɔc ye tɛ̈n yenë kɔc ye tɛ̈n yenë kɔc ye tɛ̈n yenë kɔc ye tɛ̈n yenë kɔc ye tɛ̈n yenë k
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- Foto de masin ee yiic.
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Karakteristika
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Specifications
Karakteristika
Karakteristika
Image High Resolution
Hitachi's high-brightness electron source ee kɛ̈ɛ̈l ye kɛ̈ɛ̈l ye kɛ̈ɛ̈l ye kɛ̈ɛ̈l ye kɛ̈ɛ̈l ye kɛ̈ɛ̈l.
A tïŋ RHO type zeolite në 0.8 kV voltage condition. A gɛɛn ye foto ye particle ye, a jiin ye foto ye, a gɛɛn ye foto ye, a gɛɛn ye foto ye, a gɛɛn ye foto ye, a gɛɛn ye foto ye, a gɛɛn ye foto ye, a gɛɛn ye foto ye, a gɛɛn ye foto ye. Low voltage observation ee kɛ̈ɛ̈k ye kɛ̈ɛ̈k ye kɛ̈ɛ̈k ye kɛ̈ɛ̈k ye kɛ̈ɛ̈k ye kɛ̈ɛ̈k ye kɛ̈ɛ
Sample: Japan Institute of Industrial Technology, Mr. Uemura Jiada
High liner low acceleration voltage back dispersion image
3D NAND ye tïŋ;
Në tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ
3D NAND tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n
Bɛ̈ɛ̈r BSE ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n*
Ku tɛ̈n yenë OCD detector yam luɔ̈ɔ̈i thïn, Fin-FET ye tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë t
Lɔ̈k tɛ̈n yenë SRAM looi në 5nm yic (Voltage accelerated: 30kV, scan time <1 second)
Automation ye kɛ̈ɛ̈k*
EM Flow Creator bɛ kɛ̈l kɛ̈l kɛ̈l kɛ̈l kɛ̈l kɛ̈l kɛ̈l kɛ̈l kɛ̈l kɛ̈l kɛ̈l. EM Flow Creator bɛ SEM ka baara feere-feere laar ka kɛ modules ye nyuɔɔth, cït mɛn de setting magnification, moving sample location, adjusting focal distance and bright and dark contrast. Users can drag and drop these modules in a logical order to form a work program. Users can drag and drop these modules in a logical order to form a work program. Users can drag and drop these modules in a logical order to form a work program. Users can drag and drop these modules in a logical order to form a work program. Na cï bɛ̈n ya cɔk tɛ̈ɛ̈r ku ka tɛ̈ɛ̈r yen, a bɛ̈n ya cɔk tɛ̈ɛ̈r yen bɛ̈n ya cɔk tɛ̈ɛ̈r yen bɛ̈n
Flexible user interface
Native supports dual displays, offering flexible, efficient operating space. A ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye 6 channel ye nyuɔɔth ku tɔ̈ɔ̈u, ka tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n
Signal 1, 2, 4 wala 6 channel alëu bï ya nyuɔɔth në kaam töŋ në monitor töŋ yic, ye kë lëu bï ya waar, agut cï SEM detectors ku kamera de sample room ku kamera de navigation. A lëu bï tɛ̈n looi tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye
Specifications
| Masin | SU8600 seri | |
|---|---|---|
| Elektronik optik sistem | Second Electronic Image Resolution | 0.6 nm@15 kV |
| 0.7 nm@1 kV * | ||
| Wurtin | 20 to 2,000,000 x | |
| Gun Elektronik | Cool field emitting electron source, support flexible flashing function, including anode baking system. | |
| Voltage acceleration | 0.5 to 30 kV | |
| Lɔ̈k Voltage | 0.01 to 20 kV | |
| Detektor | (Kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye) | Detektor (UD) |
| UD ExB Energy Filter, nɔŋ SE/BSE Signal Mixing Function | ||
| Low Detector (LD) | ||
| Top Detector (TD) | ||
| TD Energy Filter | ||
| Elektron Detector (IMD) ye cɔl Back Dispersion Electronic Detector (IMD) ye cɔl Back Dispersion Electronic Detector (IMD) ye cɔl Back Dispersion Electronic Detector (IMD) | ||
| Semiconductor back dispersion electronic detector (PD-BSED) ye kɔc cï gam | ||
| New Flashing Body Back Dispersion Electronic Detector (OCD) ye cɔl | ||
| Detektor fluorescent cathode (CLD) | ||
| STEM Detector | ||
| Aksesɛr | (Kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye) | Kamera Navigation, Kamera Sample Room, X-ray Energy Spectrometer (EDS), Back Dispersion Electronic Diffraction Detector (EBSD) |
| Software | (Kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye) | EM Flow Creator、HD Capture ((up to 40,960×30,720 pixels) |
| Sample Table | Motor drive axis | 5 axis motor drive (X/Y/R/Z/T) |
| Motor drive axis | X：0~110 mm | |
| Y：0~110 mm | ||
| Z：1.5~40 mm | ||
| T：-5~70° | ||
| R：360° | ||
| Sample Room | Sample size | Diameter: 150 mm |
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- Mode de réduction
Kategori Karewa
- Focus ion beam system (FIB/FIB-SEM) ye cɔl
- TEM/SEM Sample Pre-Processing Device
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