ZEISS Crossbeam series FIB-SEM ye tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ t Yïn yaa raan juëc ye luui tɛ̈n töŋ në raan töŋ, y tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈ Yïn alëu ba tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈ Na yï luɔɔi, ka foto, wala ka 3D reconstruction analysis, Crosssbeam series bï yï tɛ̈n yenë yï luɔɔi thïn ya juak apɛi.

Ne Gemini Electronic Optical System, yïn alëu ba wël cïï kek ya looi në SEM ye kek ya looi

Yïn alëu ba kä ye kek looi ya juak, ka kä ye kek tɔ̈ɔ̈u ya cɔk tɔ̈ɔ̈u ya cɔk tɔ̈ɔ̈u ya cɔk tɔ̈ɔ̈u ya cɔk tɔ̈ɔ̈u ya cɔk tɔ̈ɔ̈u ya cɔk tɔ̈ɔ̈u

Ne Ion-sculptor FIB's low voltage function, yïn alëu ba TEM samples looi, ku yïn alëu ba non-crystalline damage dɔɔr

Luɔi ye rot waar ye rot waar ye rot waar ye rot waar ye rot waar ye rot waar ye rot waar ye rot waar ye rot waar ye rot waar ye rot waar ye rot waar ye rot waar ye rot waar ye rot waar

Wala ka tɔ̈u në Crossbeam 550 bï yïn ya tɔ̈u në kë de kä wïc ye kek looi, ku ka yïn ya gäm kä wïc ye kek looi

　　EM Sample Preparation Process

Aw tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ

Crossbeam ee wɛ̈t bɛ̈n looi bɛ̈n looi bɛ̈n looi bɛ̈n looi bɛ̈n looi bɛ̈n looi bɛ̈n looi bɛ̈n looi bɛ̈n looi bɛ̈n looi bɛ̈n looi bɛ̈n looi b

1. Automatic Location <unk> ROI ye kɛ̈ɛ̈k ye kɛ̈ɛ̈k ye kɛ̈ɛ̈k ye kɛ̈ɛ̈k ye kɛ̈ɛ̈k

Yïn alëu ba ɣän ye yïn wïc yök (ROI) ka tɛ̈ɛ̈r

Lɔ̈k tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n

Yïn ye raan tɔ̈u thïn ye raan tɔ̈u thïn ye raan tɔ̈u thïn ye raan tɔ̈u thïn ye raan tɔ̈u thïn ye raan tɔ̈u thïn

Ka fotow ye tïŋ në SEM

2. Sample luɔɔi <unk> Sample ye looi

Yïn alëu ba sampol looi në kä kadiäk: ASP (Automatic Sample Preparation)

Parameters defining include drift correction, surface deposition and rough, fine cutting. Parameters defining include drift correction, surface deposition and rough, fine cutting. Parameters defining include drift correction, surface deposition and rough, fine cutting.

Fib mirror's ion optical system guarantees a high flow of work. Fib mirror's ion optical system guarantees a high flow of work. Fib mirror's ion optical system guarantees a high flow of work. Fib mirror's ion optical system guarantees a high flow of work.

Export parameters as a copy, then you can repeat operations to achieve batch preparation (Lɔ̈ɔ̈r parameters ke ye kopi, ku bï yïn ya looi ka looi ka looi ka looi ka looi ka looi ka looi ka looi ka looi ka looi)

3. Easy transfer <unk> Sample cutting, transfer mechanization

Lɔ̈ɔ̈i robot, ku lɔ̈ɔ̈i kä ye kek looi në piny de robot

Lɔ̈k kä ye kek tɔ̈ɔ̈u në kä ye kek tɔ̈ɔ̈u në kä ye kek tɔ̈ɔ̈u në kä ye kek tɔ̈ɔ̈u në kä ye kek tɔ̈ɔ̈u

A bɛ̈n tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u TEM Gate Network

4. Sample thinning - a key step to getting high quality TEM samples

Kä ye kek looi aye kɔc cï luɔ̈ɔ̈i bɛ̈n ya tɛ̈n yenë kä ye kek looi ya tɛ̈n yenë kek looi ya tɛ̈n yenë kek looi.

Yïn alëu ba tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yen

Lɔ̈k kä puɔth ye kek looi, ku lɔ̈k kä ye kek tɛ̈n ye kek tɛ̈n ye kek tɛ̈n ye kek tɛ̈n ye kek tɛ̈n ye kek tɛ̈n